2-WAVELENGTH HOLOGRAPHY FOR MEASURING PLASMA ELECTRON-DENSITY

被引：14

作者：

RADLEY, RJ ^{[1
]}

机构：

[1] GEN RES CORP,WASHINGTON OPERATIONS,MCLEAN,VA 22101

来源：

PHYSICS OF FLUIDS | 1975年 / 18卷 / 02期

关键词：

D O I：

10.1063/1.861124

中图分类号：

O3 [力学];

学科分类号：

08 ; 0801 ;

摘要：

引用

页码：175 / 179

页数：5

共 50 条

[1] 2-WAVELENGTH BEAM DEFLECTION TECHNIQUE FOR ELECTRON-DENSITY MEASUREMENTS IN LASER-PRODUCED PLASMAS
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[4] FRINGE FORMATION IN 2-WAVELENGTH CONTOUR HOLOGRAPHY
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[5] MEASURING IONOSPHERIC ELECTRON-DENSITY USING THE PLASMA FREQUENCY PROBE
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[8] 2-WAVELENGTH HOLOGRAPHY WITH LASER INTERFEROMETER SYSTEMS OF MODULAR DESIGN
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[J]. F&M-FEINWERKTECHNIK & MESSTECHNIK, 1985, 93 (01): : 27 - 30
[9] A NEW WAY MEASURING THE ELECTRON-DENSITY OF LASER-PRODUCED PLASMA
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[10] 2-WAVELENGTH HOLOGRAPHIC INTERFEROMETRY FOR PLASMA DIAGNOSTICS
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