UNCERTAINTY IN THE RESIDUAL-STRESSES ANALYSIS BY X-RAYS DIFFRACTION

被引：9
|
作者：
KAHLOUN, C [1 ]
BADAWI, KF [1 ]
DIOU, A [1 ]
机构：
[1] IUT,GER LAB,LE CREUSOT,FRANCE
来源：
REVUE DE PHYSIQUE APPLIQUEE | 1990年 / 25卷 / 12期
关键词：
D O I：
10.1051/rphysap:0199000250120122500
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：1225 / 1238
页数：14
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