DOUBLE CRYSTAL SYNCHROTRON X-RAY-DIFFRACTION STUDY OF STOICHIOMETRY IN GALLIUM-ARSENIDE

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COCKERTON, S

GREEN, GS

TANNER, BK

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CHARACTERIZATION OF THE STRUCTURE AND CHEMISTRY OF DEFECTS IN MATERIALS | 1989年 / 138卷

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T [工业技术];

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08 ;

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页码：65 / 70

页数：6

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