ELECTRICAL ENDURANCE TESTS FAVOR VACUUM

被引:0
|
作者
AUTON, G
机构
来源
ELECTRICAL REVIEW | 1976年 / 199卷 / 19期
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:32 / 33
页数:2
相关论文
共 50 条
  • [1] Random Occurrence of Contact Welding in Electrical Endurance Tests
    Zhao, Laijun
    Li, Zhenbiao
    Zhang, Hansi
    Hasegawa, Makoto
    IEICE TRANSACTIONS ON ELECTRONICS, 2011, E94C (09): : 1362 - 1368
  • [2] Monitor of electrical endurance of vacuum circuit breaker's contacts
    Cai, ZY
    Ma, SH
    Li, W
    Wang, J
    Wang, EZ
    ISDEIV: XXTH INTERNATIONAL SYMPOSIUM ON DISCHARGES AND ELECTRICAL INSULATION IN VACUUM, PROCEEDINGS, 2002, 20 : 483 - 486
  • [3] ON THE ELECTRICAL ENDURANCE CHARACTERIZATION OF INSULATING MATERIALS BY CONSTANT AND PROGRESSIVE STRESS TESTS
    MONTANARI, GC
    CACCIARI, M
    IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1992, 27 (05): : 1000 - 1008
  • [4] Electrical endurance tests for HV circuit-breakers : EDF experience
    Jeanjean, R
    Salzard, C
    Migaud, P
    2002 IEEE POWER ENGINEERING SOCIETY WINTER MEETING, VOLS 1 AND 2, CONFERENCE PROCEEDINGS, 2002, : 294 - 298
  • [5] The endurance tests
    Anon
    Telephony, 2001, 241 (05)
  • [6] Tests of endurance
    Anon
    Canadian Packaging, 2001, 54 (04):
  • [7] VOLTAGE ENDURANCE TESTS
    PATTINI, G
    SIMONI, L
    ELETTROTECNICA, 1977, 64 (08): : 660 - 661
  • [8] ENDURANCE OF POLYOLEFINES IN VACUUM AND IN AIR
    VELIEV, SI
    SANFIROVA, TP
    VETTEGREN, VI
    VYSOKOMOLEKULYARNYE SOEDINENIYA SERIYA B, 1975, 17 (03): : 183 - 185
  • [9] STATISTICAL EVALUATION OF ACCELERATED VOLTAGE ENDURANCE TESTS ON MICA INSULATION FOR ROTATING ELECTRICAL MACHINES
    WICHMANN, A
    GRUNEWALD, P
    IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1990, 25 (02): : 319 - 323
  • [10] Study of fuzzy theory based comprehensive judgement on the interrupted electrical endurance of vacuum circuit breaker
    Lin, Xin
    Zhang, Guansheng
    Hong, Cui
    Zhongguo Dianji Gongcheng Xuebao/Proceedings of the Chinese Society of Electrical Engineering, 2000, 20 (02): : 15 - 18