AN AGE REPLACEMENT POLICY WITH MINIMAL REPAIR AND GENERAL RANDOM REPAIR COST

被引:2
|
作者
SHEU, SH [1 ]
LIOU, CT [1 ]
机构
[1] NATL TAIWAN INST TECH,DEPT CHEM ENGN,TAIPEI,TAIWAN
来源
MICROELECTRONICS AND RELIABILITY | 1992年 / 32卷 / 09期
关键词
D O I
10.1016/0026-2714(92)90652-2
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
An age replacement policy is introduced which incorporates minimal repair, replacement, and general random repair costs. If an operating unit fails at age y<T, it is either replaced by a new unit with probability p(y) at a cost c0, or it undergoes minimal repair with probability q(y)=1-p(y). Otherwise, a unit is replaced when it fails for the first time after age T. The cost of the i-th minimal repair of an unit at age y depends on the random part C(y) and the deterministic part c(i)(y). The aim of the paper is to find the optimal T which minimizes the long run expected cost per unit time of the policy. Various special cases are considered.
引用
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页码:1283 / 1289
页数:7
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