TUNNELING CHARACTERISTICS AT ATOMIC RESOLUTION ON CLOSE-PACKED METAL-SURFACES

被引：12
|
作者：
BERNDT, R
GIMZEWSKI, JK
SCHLITTLER, RR
机构：
[1] Zurich Research Laboratory, IBM Research Division
来源：
ULTRAMICROSCOPY | 1992年 / 42卷
关键词：
D O I：
10.1016/0304-3991(92)90318-E
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
We have observed atomic resolution in constant-current topography along close-packed directions on Cu(111), Au(110) (1 X 2) and Ag(111) surfaces in UHV. Novel experimental information obtained from tunneling I-V and I-s characteristics observed under "atomic resolution" conditions is presented. Our results are discussed in the light of current theoretical models. We suggest that foreign material in the tip apex plays an important role in the imaging mechanism.
引用
收藏
页码：528 / 532
页数：5
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