CAPACITANCE CHARACTERIZATION OF GAINAS GROWN ON GAAS BY MBE

被引：0
|
作者：
SCHAFF, WJ
EASTMA, L
KAVANAGH, KL
KIRCHNER, PD
PETIT, GD
WOODALL, JM
机构：
[1] CORNELL UNIV,ELECT ENGN,ITHACA,NY 14853
[2] CORNELL UNIV,DEPT MAT SCI & ENGN,ITHACA,NY 14853
[3] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
来源：
JOURNAL OF ELECTRONIC MATERIALS | 1986年 / 15卷 / 05期
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
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页码：303 / 303
页数：1
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