RELIABILITY-ANALYSIS FOR VLSI ELECTRONIC SYSTEMS

被引：0

作者：

SNOWDEN, CM ^{[1
]}

POLLARD, RD ^{[1
]}

OCONNOR, PDT ^{[1
]}

机构：

[1] BRITISH AEROSP DYNAM GRP,STEVENAGE SG1 8JU,ENGLAND

来源：

关键词：

D O I：

10.1016/0143-8174(86)90052-1

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：21 / 28

页数：8

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