HYPERFINE INTERACTIONS AND RUTHERFORD BACKSCATTERING STUDIES OF CD AND HG IN CDTE SINGLE-CRYSTALS AND THIN-FILMS

被引:6
|
作者
CORREIA, JG
MELO, AA
DASILVA, MF
SOARES, JC
HAAS, H
SERRANO, MD
DIEGUEZ, E
机构
[1] HAHN MEITNER INST KERNFORSCH BERLIN GMBH,W-1000 BERLIN,GERMANY
[2] UNIV AUTONOMA MADRID,CIV,DEPT FIS APLICADA,E-28049 MADRID,SPAIN
[3] LAB NAC ENGN & TECHNOL IND,ICEN,DEPT FIS,P-2685 SACAVEM,PORTUGAL
关键词
D O I
10.1016/0168-583X(92)95206-7
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
First results obtained with the e--gamma PAC technique recently installed at CERN/ISOLDE and Rutherford backscattering measurements for as grown and Cd-111m and Hg-197m implanted CdTe single crystals and thin films are presented. Both probes, Cd and Hg, have a completely different behavior. While most of the Hg atoms have a cubic surrounding in the CdTe lattice, after ion implantation only a small fraction of the Cd atoms occupy regular lattice sites without defects even after high temperature implantation or furnace annealing.
引用
收藏
页码:248 / 253
页数:6
相关论文
共 50 条
  • [1] QUANTITATIVE RUTHERFORD BACKSCATTERING FROM THIN-FILMS
    CHU, WK
    LANGOUCHE, G
    [J]. MRS BULLETIN, 1993, 18 (01) : 32 - 40
  • [2] STRUCTURE OF THIN-FILMS ON THE SURFACES OF SINGLE-CRYSTALS
    BOLSHOV, LA
    VESHCHUNOV, MS
    DYKHNE, AM
    [J]. ZHURNAL EKSPERIMENTALNOI I TEORETICHESKOI FIZIKI, 1981, 80 (05): : 1997 - 2003
  • [3] ANALYSIS OF LEAD AZIDE THIN-FILMS BY RUTHERFORD BACKSCATTERING
    WINDAWI, HM
    VARMA, SP
    COOPER, CB
    WILLIAMS, F
    [J]. JOURNAL OF APPLIED PHYSICS, 1976, 47 (08) : 3418 - 3420
  • [4] PHOTOCONDUCTIVITY ON EUROPIUM OXIDE SINGLE-CRYSTALS AND THIN-FILMS
    LLINARES, C
    GOUSKOV, L
    DUCHEMIN, C
    BORDURE, G
    [J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1975, 36 (06) : 567 - 573
  • [5] RUTHERFORD BACKSCATTERING AND CHANNELING STUDIES OF CLEAVED, POLISHED, AND ANNEALED MGO (100) SINGLE-CRYSTALS
    KIM, SS
    BAIK, S
    [J]. JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1994, 77 (01) : 230 - 234
  • [6] RUTHERFORD BACKSCATTERING ANALYSIS OF GLASS SURFACES AND TIOX THIN-FILMS
    FISCHER, H
    HACKER, E
    SCHIRMER, G
    [J]. THIN SOLID FILMS, 1981, 85 (3-4) : 343 - 347
  • [7] ELECTRICAL-RESISTIVITY OF SINGLE-CRYSTALS AND THIN-FILMS OF SNSE
    SIDDIQUI, SS
    DESAI, CF
    [J]. CRYSTAL RESEARCH AND TECHNOLOGY, 1994, 29 (02) : K26 - K30
  • [8] ELECTRICAL CHARACTERIZATION OF SEMICONDUCTING DIAMOND THIN-FILMS AND SINGLE-CRYSTALS
    VONWINDHEIM, JA
    VENKATESAN, V
    MALTA, DM
    DAS, K
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 1993, 22 (04) : 391 - 398
  • [9] HOMOEPITAXIAL GROWTH OF YBCO THIN-FILMS ON YBCO SINGLE-CRYSTALS
    KONISHI, M
    WEN, JG
    FUKE, H
    MATSUNAGA, Y
    HAYASHI, K
    ODAGAWA, A
    ENOMOTO, Y
    SAKAI, H
    YAMADA, Y
    KOYAMA, S
    SHIOHARA, Y
    [J]. IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 1995, 5 (02) : 1229 - 1232
  • [10] IMPLANTATION OF NI THIN-FILMS AND SINGLE-CRYSTALS WITH AG IONS
    WANG, P
    THOMPSON, DA
    SMELTZER, WW
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1985, 7-8 (MAR): : 97 - 102