OPERATIONAL CHARACTERISTICS OF CMOS OP-AMPS AT CRYOGENIC TEMPERATURES

被引：13
|
作者：
DEEN, MJ
机构：
[1] Simon Fraser Univ, Burnaby, BC, Can, Simon Fraser Univ, Burnaby, BC, Can
来源：
SOLID-STATE ELECTRONICS | 1988年 / 31卷 / 02期
关键词：
D O I：
10.1016/0038-1101(88)90145-1
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
30
引用
收藏
页码：291 / 297
页数：7
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