1ST ORDER RAMAN-SCATTERING AS A TEMPERATURE PROBE FOR LASER-HEATED SILICON

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作者：
ABBI, SC
MAHESHWARI, R
SHUKLA, AK
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RESEARCH AND INDUSTRY | 1985年 / 30卷 / 03期
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T [工业技术];
学科分类号：
08 ;
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页码：337 / 339
页数：3
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