共 50 条
- [1] SOME POSSIBILITIES OF THE 3-CRYSTAL X-RAY-DIFFRACTOMETRY METHOD IN THE INVESTIGATION OF THE STRUCTURE OF SINGLE-CRYSTALS AND SURFACE-LAYERS [J]. KRISTALLOGRAFIYA, 1984, 29 (05): : 888 - 892
- [3] SLANTING ASYMMETRIC X-RAY TOPOGRAPHY OF SURFACE-LAYERS IN SINGLE-CRYSTALS [J]. UKRAINSKII FIZICHESKII ZHURNAL, 1990, 35 (03): : 444 - 448
- [4] SINGLE-CRYSTAL X-RAY DIFFRACTOMETER FOR TESTING OF THE STRUCTURE OF SUBMICRON SURFACE-LAYERS OF SINGLE-CRYSTALS [J]. INDUSTRIAL LABORATORY, 1993, 59 (05): : 483 - 487
- [5] Investigation of ion-implanted layers by X-ray reflectometry method [J]. X-RAY AND NEUTRON CAPILLARY OPTICS II, 2005, 5943 : 143 - 149
- [9] X-Ray Interferometric Investigation of Deformation Fields in Ion-Implanted Silicon Crystals [J]. JOURNAL OF SURFACE INVESTIGATION, 2011, 5 (01): : 155 - 158
- [10] X-ray interferometric investigation of deformation fields in ion-implanted silicon crystals [J]. Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques, 2011, 5 : 155 - 158