SPECIAL SECTION ON THE 12TH IEEE VLSI SYMPOSIUM

被引：0
|
作者：
MALY, W [1 ]
ZORIAN, Y [1 ]
机构：
[1] AT&T BELL LABS,TEST & RELIABIL CTR EXCELLENCE,PRINCETON,NJ
来源：
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | 1995年 / 14卷 / 05期
关键词：
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：529 / 530
页数：2
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