The determination of critical temperature from index of refraction

被引：10

|

作者：

Wan, SW ^{[1
]}

机构：

[1] Hua Chung Coll, Yale China Sch Sci, Dept Chem, Hsichow, Yunnan, Peoples R China

来源：

JOURNAL OF PHYSICAL CHEMISTRY | 1941年 / 45卷 / 06期

关键词：

D O I：

10.1021/j150411a003

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

收藏

页码：903 / 907

页数：5

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