AC MEASUREMENTS OF THICK-FILM CONDUCTOR INSULATOR SYSTEM NEAR THE PERCOLATION-THRESHOLD

被引：1

作者：

NITSCH, K

DZIEDZIC, A

GOLONKA, L

机构：

[1] Institute of Electron Technology, Technical University, Wroclaw, 50-370

来源：

INTERNATIONAL JOURNAL OF ELECTRONICS | 1991年 / 70卷 / 03期

关键词：

D O I：

10.1080/00207219108921303

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

AC measurements of a model two-phase thick-film system in the frequency range 10 mHz to 10 MHz have been performed. The influence of manufacturing conditions (glass-to-bismuth ruthenate ratio and peak firing temperature) as well as the topology of test samples on AC conductance and capacitance has been analysed.

引用

页码：515 / 520

页数：6

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