RELIABILITY CHARACTERIZATION OF HIGH-SPEED CMOS LOGIC ICS

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作者：
GOTTESFELD, S
GIBBONS, L
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来源：
RCA REVIEW | 1984年 / 45卷 / 02期
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TM [电工技术]; TN [电子技术、通信技术];
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0808 ; 0809 ;
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页码：179 / 193
页数：15
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