THE OPTICAL-PROPERTIES OF THIN ERBIUM FILMS

被引：1
|
作者：
ONCAN, N
WARD, L
PLAYER, MA
机构：
[1] COVENTRY UNIV, COVENTRY, ENGLAND
[2] UNIV ABERDEEN, ABERDEEN AB9 1FX, SCOTLAND
来源：
OPTICS AND LASER TECHNOLOGY | 1994年 / 26卷 / 05期
关键词：
THIN FILMS; ERBIUM; DIELECTRIC CONSTANT; OPTICAL PROPERTIES;
D O I：
10.1016/0030-3992(94)90124-4
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
The effective dielectric constant, epsilon2', of very thin films of erbium on sodium chloride substrates was determined from measurements of normal incidence reflectance and transmittance in the visible spectrum. Epsilon2' showed a maximum which moved to longer wavelengths as the film thickness increased. Electron microscopy revealed that the film islands grew flatter and more irregular with thickness. The shape factor of the islands, F, was calculated by a modified Maxwell-Garnett method and became smaller as the film thickness increased.
引用
收藏
页码：361 / 364
页数：4
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