THRESHOLD ELECTRONIC-ENERGY LOSS FOR THE CREATION OF LATENT TRACKS IN Y3FE5O12 AND BAFE12O19 OXIDES IRRADIATED BY HIGH-ENERGY HEAVY-IONS

被引:48
|
作者
STUDER, F [1 ]
GROULT, D [1 ]
NGUYEN, N [1 ]
TOULEMONDE, M [1 ]
机构
[1] CIRIL, F-14040 CAEN, FRANCE
关键词
D O I
10.1016/S0168-583X(87)80171-4
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:856 / 859
页数:4
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