RELIABILITY-ANALYSIS OF A MULTISTATE ONE-UNIT REPAIRABLE SYSTEM OPERATING UNDER A CHANGING ENVIRONMENT

被引：1

作者：

GUO, TD ^{[1
]}

CAO, JH ^{[1
]}

机构：

[1] CHINESE ACAD SCI,INST APPL MATH,BEIJING,PEOPLES R CHINA

来源：

MICROELECTRONICS AND RELIABILITY | 1992年 / 32卷 / 03期

关键词：

D O I：

10.1016/0026-2714(92)90074-U

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper studies a multistate repairable system operating under changing environment subject to a Markov process with two states. Failure rates are constant while the repair rates are general. Regenerative technique in MRP is applied to obtain several reliability characteristics of interest to system designers.

引用

页码：439 / 443

页数：5

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