A/D CONVERTER CHARACTERIZATION BY SPECTRAL-ANALYSIS IN DUAL-TONE MODE

被引：25
|
作者：
BENKAIS, M
LEMASSON, S
MARCHEGAY, P
机构：
[1] IXL, Universite Bordeaux I, Talence
来源：
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1995年 / 44卷 / 05期
关键词：
D O I：
10.1109/19.414504
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Analog-to-digital (A/D) converter performances are constantly improving, concerning both conversion speed and resolution. Consequently, characterization becomes harder as the limits of the testing instrumentation are reached. We tried to answer that problem by defining a test methodology based on ''dual-tone'' spectral analysis. In this paper we will present both the basic principles of this method and also experimental results on A/D converters.
引用
收藏
页码：940 / 944
页数：5
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