SURFACE ENHANCED RAMAN-SPECTROSCOPY (SERS) OF THIN ORGANIC FILMS

被引：0
|
作者：
FERRIS, NS
LITTMAN, JE
机构：
[1] EASTMAN KODAK CO,DIV ANALYT TECHNOL,ROCHESTER,NY 14650
[2] EASTMAN KODAK CO,CORP RES LAB,ROCHESTER,NY 14650
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 1988年 / 195卷
关键词：
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
引用
收藏
页码：206 / PHYS
相关论文
共 50 条
  • [1] SURFACE ENHANCED RAMAN-SPECTROSCOPY (SERS)
    OTTO, A
    [J]. SURFACE SCIENCE, 1982, 117 (1-3) : 330 - 330
  • [2] PREPARATION OF GOLD ELECTRODES FOR SURFACE ENHANCED RAMAN-SPECTROSCOPY SERS
    HOLZE, R
    [J]. SURFACE SCIENCE, 1988, 202 (03) : L612 - L620
  • [3] SURFACE-ENHANCED RAMAN-SPECTROSCOPY (SERS) OF POLYMER SILVER INTERPHASES
    BOERIO, FJ
    YOUNG, JT
    TSAI, WH
    CLARSON, SJ
    [J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1990, 200 : 362 - POLY
  • [4] SURFACE-ENHANCED RAMAN-SPECTROSCOPY (SERS) OF BIO-POLYMERS
    KOGLIN, E
    SEQUARIS, JM
    LEWINSKY, HW
    VALENTA, P
    NURNBERG, HW
    [J]. FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1985, 321 (07): : 638 - 639
  • [5] SURFACE ENHANCED RAMAN-SPECTROSCOPY
    VANDUYNE, RP
    [J]. BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1979, 24 (03): : 296 - 296
  • [6] SURFACE ENHANCED RAMAN-SPECTROSCOPY
    DORNHAUS, R
    [J]. FESTKORPERPROBLEME-ADVANCES IN SOLID STATE PHYICS, 1982, 22 : 201 - 228
  • [7] SURFACE ENHANCED RAMAN-SPECTROSCOPY
    VANDUYNE, RP
    ALLEN, CS
    SCHULTZ, S
    [J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1979, (SEP): : 103 - 103
  • [8] SURFACE ENHANCED RAMAN-SPECTROSCOPY
    BIRKE, RL
    LOMBARDI, JR
    SANCHEZ, LA
    [J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1981, 181 (MAR): : 53 - ANYL
  • [9] INVESTIGATION OF THIN POLYMERIC FILMS AND ORGANIC MONOLAYERS WITH RAMAN-SPECTROSCOPY
    RABOLT, JF
    SANTO, R
    SWALEN, JD
    [J]. BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1980, 25 (03): : 400 - 400
  • [10] ENHANCED WAVE-GUIDE RAMAN-SPECTROSCOPY WITH THIN-FILMS
    ELLAHI, S
    HESTER, RE
    [J]. ANALYST, 1994, 119 (04) : 491 - 495
12345