MODELING OF THE FREQUENCY-MODULATION RESPONSE OF SEMICONDUCTOR DIODE-LASERS

被引：10

作者：

HAFSKJAER, L ^{[1
]}

SUDBO, AS ^{[1
]}

机构：

[1] UNIV OSLO,INST PHYS,N-0316 OSLO 3,NORWAY

来源：

IEEE JOURNAL OF QUANTUM ELECTRONICS | 1988年 / 24卷 / 04期

关键词：

D O I：

10.1109/3.171

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：625 / 634

页数：10

共 50 条

[1] CURRENT-INDUCED FREQUENCY-MODULATION IN DIODE-LASERS
DANDRIDGE, A
GOLDBERG, L
[J]. ELECTRONICS LETTERS, 1982, 18 (07) : 302 - 304
[2] MAGNITUDE AND PHASE CHARACTERISTICS OF FREQUENCY-MODULATION IN DIRECTLY MODULATED GAALAS SEMICONDUCTOR DIODE-LASERS
WELFORD, D
ALEXANDER, SB
[J]. JOURNAL OF LIGHTWAVE TECHNOLOGY, 1985, 3 (05) : 1092 - 1099
[3] FORMULAS FOR DIRECT FREQUENCY-MODULATION RESPONSE OF 2-ELECTRODE DIODE-LASERS - PROPOSALS FOR IMPROVEMENT
NILSSON, O
GILLNER, L
GOOBAR, E
[J]. ELECTRONICS LETTERS, 1987, 23 (25) : 1371 - 1372
[4] CIRCUIT MODELS FOR FREQUENCY-MODULATION RESPONSE OF SEMICONDUCTOR-LASERS
HONG, WH
SO, JH
PARK, HK
MCINERNEY, JG
[J]. ELECTRONICS LETTERS, 1989, 25 (09) : 591 - 592
[5] Frequency-modulation spectroscopy with blue diode lasers
Gustafsson, U
Somesfalean, G
Alnis, J
Svanberg, S
[J]. APPLIED OPTICS, 2000, 39 (21) : 3774 - 3780
[6] THE FREQUENCY CHIRP OF CURRENT MODULATED SEMICONDUCTOR DIODE-LASERS
SUDBO, AS
[J]. IEEE JOURNAL OF QUANTUM ELECTRONICS, 1986, 22 (07) : 1006 - 1008
[7] PICOSECOND SEMICONDUCTOR DIODE-LASERS
IPPEN, EP
EILENBERGER, DJ
DIXON, RW
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1980, 70 (06) : 668 - 668
[8] DIRECT FREQUENCY-MODULATION IN ALGAAS SEMICONDUCTOR-LASERS
KOBAYASHI, S
YAMAMOTO, Y
ITO, M
KIMURA, T
[J]. IEEE JOURNAL OF QUANTUM ELECTRONICS, 1982, 18 (04) : 582 - 595
[9] DETERMINATION OF ABSORPTION-LINE PARAMETERS USING 2-TONE FREQUENCY-MODULATION SPECTROSCOPY WITH DIODE-LASERS
KAURANEN, P
AVETISOV, VG
[J]. OPTICS COMMUNICATIONS, 1994, 106 (4-6) : 213 - 217
[10] HIGH-FREQUENCY WAVELENGTH MODULATION SPECTROSCOPY WITH DIODE-LASERS
POKROWSKY, P
ZAPKA, W
CHU, F
BJORKLUND, GC
[J]. OPTICS COMMUNICATIONS, 1983, 44 (03) : 175 - 179

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