MEASUREMENT OF THE X-RAY ANOMALOUS SCATTERING OF GERMANIUM K-EDGE WITH SYNCHROTRON X-RAYS

被引：3

作者：

KATOH, H ^{[1
]}

SHIMAKURA, H ^{[1
]}

OGAWA, T ^{[1
]}

HATTORI, S ^{[1
]}

KOBAYASHI, Y ^{[1
]}

UMEZAWA, K ^{[1
]}

ISHIKAWA, T ^{[1
]}

ISHIDA, K ^{[1
]}

机构：

[1] NATL LAB HIGH ENERGY PHYS,TSUKUBA,IBARAKI 30032,JAPAN

来源：

JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN | 1985年 / 54卷 / 03期

关键词：

PHOTONS; -; PHYSICS; Atomic;

D O I：

10.1143/JPSJ.54.881

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The X-ray refractive indices for the wavelengths near the K-absorption edge of Ge have been measured by the prism method at the KEK Photon Factory. The dispersion relation of the real part of the atomic scattering factor was obtained.

引用

页码：881 / 884

页数：4

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