Transmission electron microscope in-situ observations of twinning in the lamellar microstructure in a TiAl based alloy

被引：1
|
作者：
Meng, XK
Liu, ZG
机构：
[1] National Laboratory of Solid State Microstructures, Nanjing University, Nanjing
来源：
MATERIALS LETTERS | 1995年 / 25卷 / 5-6期
关键词：
Titanium alloys;
D O I：
10.1016/0167-577X(95)00185-9
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The process of tensile deformation of the two-phase lamellar gamma(L1(0))/alpha(2)(DO19) microstructure in a TiAl based alloy was investigated by in-situ transmission electron microscopy. The strain contrast in ''soft'' alpha(2) lamella and twinning in ''hard'' gamma lamella are observed when the lamellar structure is loaded. It is suggested that the relaxation of the twinning strain by alpha(2) plays an important role in ductility improvement of the lamellar structure and the twinning is an important deformation mechanism in the two-phase TiAl alloys.
引用
收藏
页码：235 / 237
页数：3
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