FAULT-TOLERANCE AND DIAGNOSABILITY OF A CLASS OF BINOMIAL INTERCONNECTION NETWORKS

被引：0
|
作者：
GHAFOOR, A
BASHKOW, TR
GHAFOOR, I
机构：
[1] COLUMBIA UNIV,NEW YORK,NY 10027
[2] BRONX COMMUNITY COLL,BRONX,NY
来源：
AFIPS CONFERENCE PROCEEDINGS | 1986年 / 55卷
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：297 / &
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