REPORT OF THE 4TH CONFERENCE OF THE ISRAEL-SOCIETY-FOR-QUALITY-ASSURANCE

被引：0

作者：

JACOBS, RM

机构：

来源：

MICROELECTRONICS AND RELIABILITY | 1983年 / 23卷 / 02期

关键词：

D O I：

10.1016/0026-2714(83)90329-3

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：213 / 214

页数：2

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