OPTICAL HOMODYNE FREQUENCY-DOMAIN REFLECTOMETER USING AN EXTERNAL-CAVITY SEMICONDUCTOR-LASER

被引：4
|
作者：
LEE, CW
PENG, ET
SU, CB
机构：
[1] Department of Electrical Engineering, Texas A & M University, College Station
来源：
IEEE PHOTONICS TECHNOLOGY LETTERS | 1995年 / 7卷 / 06期
关键词：
D O I：
10.1109/68.388758
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
An external cavity traveling-wave semiconductor ring laser with narrow linewidth is used as a light source for research in frequency domain reflectometry. The optical frequency of the laser is linearly chirped by an intra-cavity phase modulator. Time-delayed reflection signal is mixed with a reference signal to produce as microwave frequency that indicates the position of the reflection. For optical fiber measurement, a spatial resolution of 30 m and a one-way dynamic range of 28 dB for Rayleigh backscattered light have been achieved.
引用
收藏
页码：664 / 666
页数：3
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