ON THE ANALYSIS OF ACCELERATED LIFE TEST DATA

被引:0
|
作者
JOHNSON, N
机构
关键词
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:460 / 463
页数:4
相关论文
共 50 条
  • [1] Modeling and analysis of accelerated life test data
    Andonova, A
    24TH INTERNATIONAL SPRING SEMINAR ON ELECTRONICS TECHNOLOGY: CONCURRENT ENGINEERING IN ELECTRONIC PACKAGING, CONFERENCE PROCEEDINGS, 2001, : 306 - 309
  • [2] Tools for Analysis of Accelerated Life and Degradation Test Data
    Smith, Reuel
    Modarres, Mohammad
    2016 IEEE ACCELERATED STRESS TESTING & RELIABILITY CONFERENCE (ASTR), 2016,
  • [3] Accelerated life test data analysis for repairable systems
    Yun, WY
    Kim, ES
    Cha, JH
    Proceedings of the 4th International Conference on Quality & Reliability, 2005, : 685 - 694
  • [4] Accelerated life test data analysis for repairable systems
    Yun, Won Young
    Kim, Eun Suk
    Cha, Ji Hwan
    COMMUNICATIONS IN STATISTICS-THEORY AND METHODS, 2006, 35 (10) : 1803 - 1814
  • [5] Robust Quantile Analysis for Accelerated Life Test Data
    Chen, Nan
    Tang, Yanlin
    Ye, Zhi-Sheng
    IEEE TRANSACTIONS ON RELIABILITY, 2016, 65 (02) : 901 - 913
  • [6] Graphical analysis of incomplete accelerated life test data
    HAHN GJ
    NELSON W
    1971, 17 (10): : 79 - 84
  • [7] GRAPHICAL ANALYSIS OF ACCELERATED LIFE TEST DATA WITH A MIX OF FAILURE MODES
    NELSON, W
    IEEE TRANSACTIONS ON RELIABILITY, 1975, 24 (04) : 230 - 237
  • [8] Analysis of accelerated life test data involving two failure modes
    Jiang, R.
    MECHATRONICS AND INTELLIGENT MATERIALS, PTS 1 AND 2, 2011, 211-212 : 1002 - 1006
  • [9] ANALYSIS OF ACCELERATED LIFE TEST DATA .2. NUMERICAL METHODS AND TEST PLANNING
    NELSON, W
    IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1972, EI 7 (01): : 36 - &
  • [10] A cloud model-based method for the analysis of accelerated life test data
    Zhang, Wenjin
    Liu, Shunli
    Sun, Bo
    Liu, Yue
    Pecht, Michael
    MICROELECTRONICS RELIABILITY, 2015, 55 (01) : 123 - 128