ANALYSIS OF CORROSION ON ALUMINUM DOUBLE-LAYER METALLIZATION

被引：6
|
作者：
WADA, T
HIGUCHI, H
AJIKI, T
机构：
[1] Matsushita Electronics Corp, QA Cent, Semiconductor Group, Nagaoka, Jpn, Matsushita Electronics Corp, QA Cent Semiconductor Group, Nagaoka, Jpn
来源：
JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1986年 / 133卷 / 02期
关键词：
D O I：
10.1149/1.2108580
中图分类号：
O646 [电化学、电解、磁化学];
学科分类号：
081704 ;
摘要：
5
引用
收藏
页码：362 / 366
页数：5
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