PICOSECOND OPTICAL ELECTRONICS - LASER-BEAMS MEASURE THE NEXT GENERATION OF MICROELECTRONIC DEVICES

被引：0
|
作者：
AUSTON, DH
SMITH, PR
机构：
来源：
BELL LABORATORIES RECORD | 1983年 / 61卷 / 01期
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
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页码：6 / 11
页数：6
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