THE ECONOMICS OF DESIGN FOR TEST .2.

被引：0
|
作者：
AMBLER, T
BENNETTS, RG
BLEEKER, H
ODONNELL, G
机构：
[1] NATL SEMICOND CORP,333 WESTERN AVE,S PORTLAND,ME 04106
[2] BRUNEL UNIV,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
来源：
EE-EVALUATION ENGINEERING | 1994年 / 33卷 / 10期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
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页码：28 / &
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