SURFACE, ADSORBATES AND NANOCHEMISTRY WITH STM AND AFM

被引：0
|
作者：
JOACHIM, C
GAUTHIER, S
机构：
[1] UNIV PARIS 06, PHYS SOLIDES GRP, F-75251 PARIS, FRANCE
[2] UNIV PARIS 07, F-75251 PARIS, FRANCE
来源：
ANNALES DE CHIMIE-SCIENCE DES MATERIAUX | 1992年 / 17卷 / 3-4期
关键词：
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
The Principles of the scanning tunneling microscope (STM) and of the atomic force microscope (AFM) are recalled together with a presentation of their applications in imaging of surfaces and in nanofabrication.
引用
收藏
页码：179 / 189
页数：11
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