DETERMINATION OF IRON IN CADMIUM AND CADMIUM TELLURIDE

被引:1
|
作者
WILKINS, DH
SMITH, GE
机构
关键词
D O I
10.1016/0039-9140(66)80207-2
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
引用
收藏
页码:1049 / &
相关论文
共 50 条
  • [1] DETERMINATION OF CADMIUM AND TELLURIUM IN CADMIUM TELLURIDE BY PAPER PEAK CHROMATOGRAPHY
    PASECHNOVA, RA
    BARDIN, VV
    MOKHOV, AA
    JOURNAL OF ANALYTICAL CHEMISTRY OF THE USSR, 1975, 30 (08): : 1262 - 1264
  • [2] DETERMINATION OF STOICHIOMETRY OF CADMIUM TELLURIDE BY XPS
    KUMAR, S
    RAMANA, JV
    RAJU, VS
    ARUNACHALAM, J
    GANGADHARAN, S
    FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY, 1992, 343 (12): : 879 - 880
  • [3] PROPERTIES OF IRON-DOPED CADMIUM TELLURIDE
    VUL, BM
    IVANOV, VS
    RUKAVISHNIKOV, VA
    SALMAN, VM
    CHAPNIN, VA
    SOVIET PHYSICS SEMICONDUCTORS-USSR, 1973, 6 (07): : 1106 - 1109
  • [4] CADMIUM TELLURIDE
    ZWEIBEL, K
    SOLAR CELLS, 1988, 23 (1-2): : R5 - R5
  • [5] Cadmium telluride
    Carah, Daniel R.
    IEEE Potentials, 1997, 16 (01): : 23 - 26
  • [6] Off stoichiometry determination in cadmium telluride crystals
    Bissoli, F
    Zappettini, A
    Zha, M
    Zanotti, L
    Paorici, C
    JOURNAL OF ALLOYS AND COMPOUNDS, 2004, 371 (1-2) : 89 - 92
  • [7] Off stoichiometry determination in cadmium telluride crystals
    Zappettini, A. (zapp@imem.cnr.it), 1600, Elsevier Ltd (371): : 1 - 2
  • [8] DETERMINATION OF CADMIUM AND TELLURIUM IN CADMIUM TELLURIDE BY METHOD OF FULL DIFFERENTIAL SPECTROPHOTOMETRY .1. DETERMINATION OF CADMIUM WITH XYLENOL ORANGE
    PASECHNO.RA
    MOKHOV, AA
    ZHURNAL ANALITICHESKOI KHIMII, 1972, 27 (11): : 2146 - +
  • [9] NONSTOICHIOMETRY OF CADMIUM TELLURIDE SATURATED WITH CADMIUM
    KHARIF, YL
    STRUNILINA, TA
    KOVTUNENKO, PV
    INORGANIC MATERIALS, 1989, 25 (04) : 496 - 501
  • [10] Mercury cadmium telluride/cadmium telluride distributed Bragg reflectors
    Wehner, JGA
    Sewell, R
    Antoszewski, J
    Musca, CA
    Dell, JM
    Faraone, L
    Commad 04: 2004 Conference on Optoelectronic and Microelectronic Materials and Devices, Proceedings, 2005, : 189 - 192