EVALUATION OF SWEET CORN HYBRIDS FOR VIRUS-RESISTANCE, YIELD, AND EAR QUALITY, 1981

被引:0
|
作者
DALE, JL [1 ]
MCFERRAN, J [1 ]
WANN, EV [1 ]
BONA, RL [1 ]
机构
[1] UNIV ARKANSAS, DEPT HORT & FORESTRY, FAYETTEVILLE, AR 72701 USA
关键词
D O I
暂无
中图分类号
S [农业科学];
学科分类号
09 ;
摘要
引用
收藏
页码:1 / 7
页数:7
相关论文
共 50 条
  • [1] SCREENING SWEET CORN FOR VIRUS-RESISTANCE, YIELD, AND QUALITY
    DALE, JL
    MCFERRAN, J
    WANN, EV
    BONA, RL
    ARKANSAS FARM RESEARCH, 1981, 30 (01): : 3 - 3
  • [2] EVALUATION OF SWEET CORN HYBRIDS FOR YIELD AND EAR QUALITY WHEN GROWN UNDER VIRUS-DISEASE CONDITIONS, 1982
    DALE, JL
    MCFERRAN, J
    WANN, EV
    BONA, RL
    ARKANSAS AGRICULTURAL EXPERIMENT STATION REPORT SERIES, 1982, (278): : 1 - 7
  • [3] YIELD AND EAR QUALITY OF SWEET CORN HYBRIDS GROWN UNDER VIRUS-DISEASE CONDITIONS, 1984
    DALE, JL
    MCFERRAN, J
    WANN, EV
    ARKANSAS AGRICULTURAL EXPERIMENT STATION REPORT SERIES, 1984, (291): : 1 - 5
  • [4] YIELD AND EAR QUALITY OF SWEET CORN HYBRIDS GROWN UNDER VIRUS-DISEASE CONDITIONS, 1986
    DALE, JL
    MCFERRAN, J
    WANN, EV
    ARKANSAS AGRICULTURAL EXPERIMENT STATION RESEARCH SERIES, 1986, (350): : 1 - 3
  • [5] YIELD AND EAR QUALITY OF SWEET CORN HYBRIDS GROWN UNDER VIRUS-DISEASE CONDITIONS, 1987
    DALE, JL
    MCFERRAN, J
    WANN, EV
    ARKANSAS AGRICULTURAL EXPERIMENT STATION RESEARCH SERIES, 1987, (362): : 1 - 3
  • [6] YIELD AND EAR QUALITY OF SWEET CORN HYBRIDS GROWN UNDER VIRUS-DISEASE CONDITIONS, 1983
    DALE, JL
    MCFERRAN, J
    WANN, EV
    ARKANSAS AGRICULTURAL EXPERIMENT STATION REPORT SERIES, 1983, (281): : 1 - 7
  • [7] YIELD AND EAR QUALITY OF SWEET CORN HYBRIDS GROWN UNDER VIRUS-DISEASE CONDITIONS, 1985
    DALE, JL
    MCFERRAN, J
    WANN, EV
    ARKANSAS AGRICULTURAL EXPERIMENT STATION REPORT SERIES, 1985, (327): : 1 - 4
  • [8] MAIZE-DWARF VIRUS-RESISTANCE RATINGS OF CORN HYBRIDS
    MILINKO, I
    PETI, J
    JOZSA, S
    KOBZA, S
    NOVENYTERMELES, 1984, 33 (02): : 147 - 155
  • [9] DEVELOPMENT OF HETEROTIC HYBRIDS OF SWEET CORN FOR GREEN EAR YIELD AND OTHER COMPONENT TRAITS
    Vanipraveena, M.
    Talekar, S. C.
    Kachampur, R. M.
    Salakinkop, S. R.
    Reddy, Patlolla Ramakanth
    BANGLADESH JOURNAL OF BOTANY, 2023, 52 (04): : 999 - 1005
  • [10] Common Smut Reduces Sweet Corn Yield and Ear Processing Quality
    Clough, George H.
    Blatchford, Sarah
    Hamm, Philip B.
    HORTSCIENCE, 2011, 46 (11) : 1507 - 1511