Universal conductance fluctuations in metallic nano-structures

被引:0
|
作者
Hegger, H [1 ]
Hecker, K [1 ]
Reckziegel, G [1 ]
Tuzinski, R [1 ]
机构
[1] RHEIN WESTFAL TH AACHEN, INST HALBLEITERTECH, D-52056 AACHEN, GERMANY
来源
NANOSTRUCTURED MATERIALS | 1995年 / 6卷 / 5-8期
关键词
D O I
10.1016/0965-9773(95)00182-4
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
WE investigated the magneto-conductance of gold nano-wires in a in mesoscopic 2-probe configuration. The nano-structures were fabricated using a four-layer resist system and Electron beam lithography. The samples consisted of a wire of length L=100-1000 nm and cross section 30 x 30 nm(2) connected to two funnel-shaped contacts, At very low temperatures T similar or equal to 100mmK the magneto-conductance of all measured devices showed a rms-value delta G approximate to 0.1e(2)/h. Our measurements demonstrate that the conductance fluctuations are strongly influenced by the contacts. This is most significant in the correlation field B-c similar to 1/F psi which decreases with decreasing wire length. We also observed a weak dependence of delta G on the wire length L which can be interpreted as a dimensional crossover from 1D (L greater than or equal to 400 nm) to 2D (L less than or equal to 200 nm).
引用
收藏
页码:807 / 810
页数:4
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