WORK FUNCTION MEASUREMENTS USING AN IMPROVED THERMIONIC PROJECTION MICROSCOPE

被引：4
|
作者：
HINRICHS, CH
MACKIE, WA
COHEN, I
ALIN, J
SCHNITZLER, D
NOEL, I
机构：
[1] Linfield Research Institute, Linfield College, McMinnville
[2] Portland, OR 97223
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1994年 / 65卷 / 12期
关键词：
D O I：
10.1063/1.1144493
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
A quantitative thermionic projection microscope, employing computer image processing, is described. In this system, thermionic emission from a single-crystal hemispherical cathode is projected onto a phosphor screen and the resulting image is digitized by means of a video camera. Single-plane effective work functions for the highest emitting planes of the cathode may be measured to within a tenth of an electron volt. © 1994 American Institute of Physics.
引用
收藏
页码：3689 / 3696
页数：8
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