Phase-sensitive interferometry with ultrashort optical pulses

被引:20
|
作者
Kop, RHJ
Sprik, R
机构
[1] van der Waals-Zeeman Laboratorium, Universiteit van Amsterdam, 1018 XE Amsterdam
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 1995年 / 66卷 / 12期
关键词
D O I
10.1063/1.1146069
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Reliable phase-sensitive time-resolved interferometry with ultrashort pulsed lasers is performed with. the use of a closed scanning Michelson interferometer in combination with a fixed Mach-Zehnder interferometer at the front end. The technique is based on measuring the full phase and frequency properties of the pulse distortion of an ultrashort optical pulse introduced by Linear or nonlinear interaction with a sample. The necessary stability and reproducibility to perform an interferometric measurement is provided by a commercially available Fourier transform spectrometer enabling time-resolved measurements from the IR well into the visible part of the optical spectrum. The feasibility of the technique is demonstrated by measuring the distortion introduced by an etalon and a surface-plasmon polariton. (C) 1995 American Institute of Physics.
引用
收藏
页码:5459 / 5463
页数:5
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