MICROX (TM) - AN ALL-SILICON TECHNOLOGY FOR MONOLITHIC MICROWAVE INTEGRATED-CIRCUITS

被引:34
|
作者
HANES, MH
AGARWAL, AK
OKEEFFE, TW
HOBGOOD, HM
SZEDON, JR
SMITH, TJ
SIERGIEJ, RR
MCMULLIN, PG
NATHANSON, HC
DRIVER, MC
THOMAS, RN
机构
[1] Westinghouse Science and Technology, Cent, Pittsburgh, PA
关键词
D O I
10.1109/55.215173
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
An improved silicon-on-insulator (SOI) approach offers devices and circuits operating to 10 GHz by providing formerly unattainable capabilities in bulk silicon: reduced junction-to-substrate capacitances in FET's and bipolar transistors, inherent electrical isolation between devices, and low-loss microstrip lines. The concept, called MICROX(TM) (patent pending), is based on the SIMOX process, but uses very high-resistivity (typically > 10 000 OMEGA.cm) silicon substrates. MICROX NMOS transistors of effective gate length (0.25 mum) give a maximum frequency of operation, f(max) of 32 GHz and f(T) of 23.6 GHz in large-periphery (4 x 50 mum) devices with no correction for the parasitic effects of the pads. The measured minimum noise figure is 1.5 dB at 2 GHz with associated gain of 17.5 dB, an improvement over previously reported values for silicon FET's.
引用
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页码:219 / 221
页数:3
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