2-WAVELENGTH ELECTRONIC SPECKLE-PATTERN INTERFEROMETRY FOR THE ANALYSIS OF DISCONTINUOUS DEFORMATION FIELDS

被引：0
|
作者：
GULKER, G
HAACK, O
HINSCH, KD
HOLSCHER, C
KULS, J
PLATEN, W
机构：
来源：
APPLIED OPTICS | 1992年 / 31卷 / 22期
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D O I：
暂无
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Ambiguity in the conversion of phase measurements to deformation values restricts the applicability of electronic speckle-pattern interferometry. The use of two wavelengths greatly relaxes this restriction.
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页码：4519 / 4521
页数：3
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