共 50 条
- [1] COMPLETE SOLUTION OF ELLIPSOMETRY INVERSE PROBLEM FOR A SINGLE-LAYER SYSTEM UNDER THE VARIATION OF FILM THICKNESS OPTIKA I SPEKTROSKOPIYA, 1989, 66 (01): : 174 - 179
- [2] ANALYTICAL SOLUTION OF ELLIPSOMETRY INVERSE PROBLEMS FOR ALL PARAMETERS OF A SINGLE-LAYER ISOTROPIC SYSTEM OPTIKA I SPEKTROSKOPIYA, 1986, 61 (03): : 636 - 639
- [3] COMPLETE SOLUTION OF THE ELLIPSOMETRY INVERSE PROBLEM FOR A SINGLE-LAYER SYSTEM UNDER VARIATION OF THICKNESS AND LIGHT-INCIDENCE ANGLE OPTIKA I SPEKTROSKOPIYA, 1988, 65 (05): : 1150 - 1155
- [5] Method of quick solution of the inverse ellipsometry problem for a transparent homogeneous layer Optoelectronics, Instrumentation and Data Processing (English translation of Avtometriya), (01):
- [6] Solution of the Inverse Spectroscopic Ellipsometry Problem for an Absorbing Substrate with a Dielectric Layer Journal of Applied Spectroscopy, 2016, 83 : 40 - 46
- [7] Stable solution of inverse problem in ellipsometry Poverkhnost Fizika Khimiya Mekhanika, (12): : 73 - 79
- [8] SOLUTION OF THE INVERSE PROBLEM OF ELLIPSOMETRY FOR INHOMOGENEOUS SYSTEMS UKRAINSKII FIZICHESKII ZHURNAL, 1984, 29 (02): : 187 - 193
- [10] EXACT SOLUTION OF INVERSE PROBLEM OF ELLIPSOMETRY FOR ABSORBING FILMS DOKLADY AKADEMII NAUK SSSR, 1991, 318 (05): : 1154 - 1158