REEMITTED-POSITRON SPECTROSCOPY OF THIN METAL-FILMS

被引:58
|
作者
GIDLEY, DW
FRIEZE, WE
机构
关键词
D O I
10.1103/PhysRevLett.60.1193
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:1193 / 1196
页数:4
相关论文
共 50 条
  • [1] REEMITTED-POSITRON SPECTROSCOPY OF COBALT AND NICKEL SILICIDE FILMS
    WISSMAN, BD
    GIDLEY, DW
    FRIEZE, WE
    PHYSICAL REVIEW B, 1992, 46 (24): : 16058 - 16066
  • [2] REEMITTED-POSITRON ENERGY-LOSS SPECTROSCOPY - A NOVEL PROBE OF ADSORBATE VIBRATIONAL LEVELS
    FISCHER, DA
    LYNN, KG
    FRIEZE, WE
    PHYSICAL REVIEW LETTERS, 1983, 50 (15) : 1149 - 1152
  • [3] SURFACE LASER SPECTROSCOPY OF ELECTRODEPOSITED THIN METAL-FILMS
    VANDUYNE, RP
    HAUSHALTER, J
    CARRON, K
    JOHNSON, B
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1985, 189 (APR-): : 86 - COLL
  • [4] POSITRON-ANNIHILATION IN METAL-FILMS
    VALIEV, KA
    GOLDANSKII, VI
    NOVIKOV, YA
    RAKOV, AV
    FILIMONOV, MK
    SHANTAROVICH, VP
    JETP LETTERS, 1987, 45 (06) : 373 - 375
  • [5] LUBRICATION WITH THIN METAL-FILMS
    KUWAHARA, K
    JOURNAL OF JAPAN SOCIETY OF LUBRICATION ENGINEERS, 1974, 19 (10): : 745 - 748
  • [6] CHEMISORPTION ON THIN METAL-FILMS
    WHITE, JM
    SCANNING MICROSCOPY, 1987, 1 (03) : 995 - 1000
  • [7] RESISTIVITY OF THIN METAL-FILMS
    CHAURASIA, HK
    VOSS, WAG
    IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1973, MT21 (01) : 51 - 52
  • [8] INTERDIFFUSION OF THIN METAL-FILMS
    BAGLIN, JEE
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1975, 122 (03) : C77 - C77
  • [9] OPTICS OF THIN METAL-FILMS
    JUENKER, DW
    AMERICAN JOURNAL OF PHYSICS, 1972, 40 (02) : 358 - &
  • [10] PRECIPITATION OF THIN METAL-FILMS
    VICENTE, VA
    UMSCHAU IN WISSENSCHAFT UND TECHNIK, 1978, 78 (23) : 737 - 737