THE EFFECT OF METAL LAYERS ON THE BAND OFFSETS AT THE SILICON-GERMANIUM INTERFACE

被引:8
|
作者
BASS, JM
MATTHAI, CC
机构
[1] Dept. of Phys., Univ. Coll. of Wales, Cardiff
关键词
D O I
10.1088/0268-1242/6/1/014
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In order to understand the process of band-offset modification by the introduction of interlayers at semiconductor heterojunctions, we performed self-consistent ab initio pseudopotential calculations on the Si/Ge interface with In and Sb interlayers. The results of the calculations show a substantial reduction in the valence band offset with the Sb interlayer compared with no interlayer but no change when In is introduced. We suggest a possible reason for these different results.
引用
收藏
页码:69 / 70
页数:2
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