PRISM SYSTEMS FOR MEASURING THE ABSOLUTE SPECULAR REFLECTANCE

被引：0

|

作者：

EFIMOV, VM

SOBOL, VP

机构：

来源：

SOVIET JOURNAL OF OPTICAL TECHNOLOGY | 1987年 / 54卷 / 06期

关键词：

D O I：

暂无

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

收藏

页码：374 / 376

页数：3

相关论文

共 50 条

[1] PRECISION MEASUREMENT OF ABSOLUTE SPECULAR REFLECTANCE WITH MINIMIZED SYSTEMATIC ERRORS
BENNETT, HE
KOEHLER, WF
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1960, 50 (01) : 1 - 6
[2] REFLECTOMETER FOR PRECISE MEASUREMENT OF ABSOLUTE SPECULAR REFLECTANCE AT NORMAL INCIDENCE
BOIVIN, G
THERIAULT, JM
REVIEW OF SCIENTIFIC INSTRUMENTS, 1981, 52 (07): : 1001 - 1002
[3] Specular gloss measurements from luminous reflectance by an absolute technique
Li, Tiecheng
Ji, Muyao
Lin, Fangsheng
Feng, Jian
Lai, Lei
2024 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS, CPEM 2024, 2024,
[4] MEASURING ABSOLUTE DIFFUSE REFLECTANCE IN THE ULTRAVIOLET
GILLESPIE, JB
LINDBERG, JD
APPLIED OPTICS, 1992, 31 (07): : 955 - 959
[5] SPECULAR REFLECTANCE
OBREMSKI, RJ
INDUSTRIAL RESEARCH, 1976, 18 (03): : 59 - 60
[6] ABSOLUTE SPECULAR REFLECTANCE MEASUREMENTS OF HIGHLY REFLECTING OPTICAL COATINGS AT 10.6 MU
KELSALL, D
APPLIED OPTICS, 1970, 9 (01): : 85 - &
[7] Symmetry X system and method for absolute measurements of reflectance and transmittance of specular samples
Kawate, E
APPLIED OPTICS, 2003, 42 (25) : 5064 - 5072
[8] METHOD OF MEASURING SMALL VALUES OF THE SPECTRAL SPECULAR REFLECTANCE ON IR SPECTROPHOTOMETERS
BRYNKOVA, TN
VOROBEV, VG
GONCHAR, TG
KRUGLYAKOVA, MA
SOVIET JOURNAL OF OPTICAL TECHNOLOGY, 1988, 55 (09): : 521 - 524
[9] SIMPLE ABSOLUTE METHOD FOR MEASURING DIFFUSE REFLECTANCE SPECTRA
SHIBATA, K
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1957, 47 (02) : 172 - 175
[10] SPECULAR REFLECTANCE OF MIRRORS
REVIE, RW
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1977, 124 (08) : 1303 - 1304

← 1 2 3 4 5 →