CAPACITANCE MEASUREMENTS ON AU-GAAS SCHOTTKY BARRIERS

被引：79

|

作者：

SENECHAL, RR

BASINSKI, J

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1968年 / 39卷 / 10期

关键词：

D O I：

10.1063/1.1655804

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

收藏

页码：4581 / +

页数：1

相关论文

共 50 条

[1] THERMIONIC EMISSION IN AU-GAAS SCHOTTKY BARRIERS
PADOVANI, FA
[J]. SOLID-STATE ELECTRONICS, 1968, 11 (02) : 193 - +
[2] ANNEALING OF INTIMATE AG, AL, AND AU-GAAS SCHOTTKY BARRIERS
NEWMAN, N
CHIN, KK
PETRO, WG
KENDELEWICZ, T
WILLIAMS, MD
MCCANTS, CE
SPICER, WE
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1985, 3 (03): : 996 - 1001
[3] ZERO-BIAS CONTACT RESISTANCES OF AU-GAAS SCHOTTKY BARRIERS
MCCOLL, M
MILLEA, MF
MEAD, CA
[J]. SOLID-STATE ELECTRONICS, 1971, 14 (08) : 677 - &
[4] HIGH SCHOTTKY BARRIERS ON AND THERMALLY INDUCED PROCESSES AT THE AU-GAAS(110) INTERFACE
PETRO, WG
BABALOLA, IA
SKEATH, P
SU, CY
HINO, I
LINDAU, I
SPICER, WE
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1982, 21 (02): : 585 - 589
[5] TEMPERATURE BEHAVIOR OF AU-GAAS SCHOTTKY CONTACTS
ENGEMANN, J
NAUMANN, J
[J]. SOLID-STATE ELECTRONICS, 1972, 15 (08) : 899 - &
[6] ANNEALING OF INTIMATE AU-GAAS SCHOTTKY BARRIERS - THICK AND ULTRATHIN METAL-FILMS
NEWMAN, N
PETRO, WG
KENDELEWICZ, T
PAN, SH
EGLASH, SJ
SPICER, WE
[J]. JOURNAL OF APPLIED PHYSICS, 1985, 57 (04) : 1247 - 1251
[7] PHOTOSENSITIVITY OF AU-GAAS SCHOTTKY BARRIERS WITH A SURFACE MICRORELIEF (FUNDAMENTAL OPTICAL-ABSORPTION REGION)
BORKOVSKAYA, OY
DMITRUK, NL
MISHCHUK, ON
[J]. SOVIET PHYSICS SEMICONDUCTORS-USSR, 1991, 25 (03): : 294 - 297
[8] PRE-BREAKDOWN PHENOMENA OF AU-GAAS SCHOTTKY DIODE
YAMASHITA, A
ARAKI, H
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1971, 10 (09) : 1282 - +
[9] ANALYSES OF TRANSIENT CAPACITANCE EXPERIMENTS FOR AU-GAAS SCHOTTKY-BARRIER DIODES IN PRESENCE OF DEEP IMPURITIES AND INTERFACIAL LAYER
HUANG, CI
LI, SS
[J]. SOLID-STATE ELECTRONICS, 1973, 16 (12) : 1481 - 1486
[10] RICHARDSON CONSTANT OF AL-GAAS AND AU-GAAS SCHOTTKY-BARRIER DIODES
BORREGO, JM
GUTMANN, RJ
ASHOK, S
[J]. APPLIED PHYSICS LETTERS, 1977, 30 (03) : 169 - 172

← 1 2 3 4 5 →