METHOD FOR MEASURING REFRACTIVE-INDEX PROFILE OF THIN-FILM WAVEGUIDES

被引：3

作者：

MITTRA, R ^{[1
]}

ITOH, T ^{[1
]}

机构：

[1] UNIV ILLINOIS,ELECT ENGN DEPT,ELECTROMAGNETICS LAB,URBANA,IL 61801

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1975年 / MT23卷 / 01期

关键词：

D O I：

10.1109/TMTT.1975.1128519

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：176 / 177

页数：2

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[1] MODE SWITCHING IN THIN-FILM WAVEGUIDES WITH BOUNDARY MODULATION OF THE REFRACTIVE-INDEX
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