A TEMPERATURE-INDEPENDENT CAPACITANCE IN SEMICONDUCTOR-INSULATOR-SEMICONDUCTOR CAPACITORS

被引:0
|
作者
HICKMOTT, TW
SOLOMON, PM
机构
[1] IBM Research Division, T.J. Watson Research Center, Yorktown Heights
关键词
D O I
10.1063/1.345133
中图分类号
O59 [应用物理学];
学科分类号
摘要
Both measurements of capacitance-voltage (C-V) curves of n- GaAs-undoped AlxGa1- xAs- n+ GaAs (AlGaAs) capacitors at different temperatures, and calculations of C-V curves of semiconductor-insulator-semiconductor (SIS) capacitors at different temperatures, show that there is a temperature-invariant capacitance C C and voltage VC at which C-V curves at different temperatures intersect. We show that this is a general property of SIS capacitors having a degenerate gate and nondegenerate substrate of the same doping type, and that qVC, where q is the electron charge, is approximately equal to the Fermi energy of the degenerate GaAs gate. V C provides a good estimate for the voltage required to establish an accumulation layer on n- GaAs at low temperatures, which is determined from magnetotunneling measurements on AlGaAs capacitors.
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页码:6548 / 6551
页数:4
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