HIGH-RESOLUTION SCANNING ELECTRON-MICROSCOPY FOR THE CHARACTERIZATION OF SUPPORTED METAL-CATALYSTS

被引：11
|
作者：
SMITH, DJ
YAO, MH
ALLARD, LF
DATYE, AK
机构：
[1] ARIZONA STATE UNIV,DEPT PHYS & ASTRON,TEMPE,AZ 85287
[2] OAK RIDGE NATL LAB,HIGH TEMP MAT LAB,OAK RIDGE,TN 37831
[3] UNIV NEW MEXICO,CTR MICROENGINEERED CERAM,ALBUQUERQUE,NM 87131
[4] UNIV NEW MEXICO,DEPT CHEM & NUCL ENGN,ALBUQUERQUE,NM 87131
来源：
CATALYSIS LETTERS | 1995年 / 31卷 / 01期
关键词：
SCANNING ELECTRON MICROSCOPY (SEM); SUPPORTED METAL CATALYSTS; SMALL METAL PARTICLES;
D O I：
10.1007/BF00817033
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
A scanning electron microscope with a short-focal-length ''immersion'' lens and subnanometer resolution has been used to characterize several oxide-supported metal particle catalysts. Nanometer-sized metal particles in the Pt/TiO2 and Pd/SiO2 systems could be imaged with best clarity at the upper end of the operating voltage range (20-30 kV). However, visibility depended upon an adequate yield of secondary electrons relative to the support: small Pt particles on CeO2 could not be located by secondary electron imaging. Best visibility of the surface topography of the support was obtained at lower accelerating voltages.
引用
收藏
页码：57 / 64
页数：8
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