DETERMINATION OF THE REFRACTIVE-INDEX, THE ABSORPTION-COEFFICIENT AND THE THICKNESS OF AMORPHOUS V2O5 THIN-FILMS FROM REFLECTANCE INTERFERENCE SPECTRA

被引：0

作者：

PHAN, L ^{[1
]}

MICHAILOVITS, L ^{[1
]}

HEVESI, I ^{[1
]}

机构：

[1] ATTILA JOZSEF UNIV,INST EXPTL PHYS,H-6701 SZEGED,HUNGARY

来源：

ACTA PHYSICA HUNGARICA | 1983年 / 54卷 / 1-2期

关键词：

D O I：

暂无

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：119 / 124

页数：6

共 50 条

[1] DETERMINATION OF THE THICKNESS AND THE REFRACTIVE-INDEX OF V2O5 THIN-FILMS FROM REFLECTANCE INTERFERENCE SPECTRA
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ACTA PHYSICA ET CHEMICA, 1979, 25 (1-2): : 29 - 41
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[3] DETERMINATION OF THE OPTICAL-CONSTANTS AND THICKNESS OF AMORPHOUS V2O5 THIN-FILMS
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[6] DETERMINATION OF REFRACTIVE-INDEX OF THIN-FILMS BEYOND THE ABSORPTION-EDGE
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[8] DETERMINATION OF THE REFRACTIVE-INDEX OF A-SI1-XCX/H THIN-FILMS FROM INFRARED-ABSORPTION SPECTRA
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[9] INFRARED-ABSORPTION SPECTRA OF EVAPORATED V2O5 AND COEVAPORATED V2O5/B2O3 THIN-FILMS
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[10] OPTICAL-ABSORPTION SPECTRA OF EVAPORATED V2O5 AND COEVAPORATED V2O5/B2O3 THIN-FILMS
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JOURNAL OF MATERIALS SCIENCE, 1991, 26 (02) : 412 - 416

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