CONTACT, HOLOGRAPHIC, AND DIFFRACTION METHODS OF SOFT-X-RAY MICROSCOPY

被引：0
|
作者：
SAYRE, D [1 ]
机构：
[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
来源：
ACTA CRYSTALLOGRAPHICA SECTION A | 1984年 / 40卷
关键词：
D O I：
10.1107/S0108767384088206
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
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页码：C402 / C402
页数：1
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