TRANSMISSION ELECTRON-MICROSCOPY OF EPITAXIAL AU ON (001) MGO

被引：21
|
作者：
HOEL, RH
机构：
来源：
SURFACE SCIENCE | 1986年 / 169卷 / 2-3期
关键词：
D O I：
10.1016/0039-6028(86)90613-8
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：317 / 326
页数：10
相关论文
共 50 条
  • [1] STUDY OF TAC EPITAXIAL-FILMS ON (001)MGO BY HIGH-RESOLUTION ELECTRON-MICROSCOPY
    KUMAO, A
    NAIKI, T
    NISHIO, K
    [J]. JOURNAL OF ELECTRON MICROSCOPY, 1984, 33 (03): : 273 - 273
  • [2] CHARACTERIZATION OF EPITAXIAL SEMICONDUCTOR STRUCTURES BY TRANSMISSION ELECTRON-MICROSCOPY
    BULLELIEUWMA, CWT
    [J]. ULTRAMICROSCOPY, 1989, 31 (04) : 459 - 460
  • [3] Transmission electron microscopy characterization of CrN films on MgO(001)
    Harzer, T. P.
    Daniel, R.
    Mitterer, C.
    Dehm, G.
    Zhang, Z. L.
    [J]. THIN SOLID FILMS, 2013, 545 : 154 - 160
  • [4] CHARACTERIZATION OF THE GAP/SI(001) INTERFACE BY TRANSMISSION ELECTRON-MICROSCOPY
    PACHECO, FJ
    KIELY, CJ
    MOLINA, SI
    ARAGON, G
    GARCIA, R
    [J]. ELECTRON MICROSCOPY AND ANALYSIS 1993, 1993, (138): : 317 - 320
  • [5] ASSESSMENT OF SEMICONDUCTOR EPITAXIAL-GROWTH BY TRANSMISSION ELECTRON-MICROSCOPY
    BROWN, PD
    HUMPHREYS, CJ
    [J]. MATERIALS SCIENCE AND TECHNOLOGY, 1995, 11 (01) : 54 - 65
  • [6] PREPARATION OF SECTIONS OF HETEROPHASE EPITAXIAL STRUCTURES FOR TRANSMISSION ELECTRON-MICROSCOPY
    RUBANOV, SV
    PINTUS, SM
    GUTAKOVSKII, AK
    [J]. INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1989, 32 (03) : 708 - 711
  • [7] In-situ nanoindentation of epitaxial TiN/MgO (001) in a transmission electron microscope
    Minor, AM
    Stach, EA
    Morris, JW
    Petrov, I
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 2003, 32 (10) : 1023 - 1027
  • [8] In-situ nanoindentation of epitaxial TiN/MgO (001) in a transmission electron microscope
    A. M. Minor
    E. A. Stach
    J. W. Morris
    I. Petrov
    [J]. Journal of Electronic Materials, 2003, 32 : 1023 - 1027
  • [9] ELECTRON-MICROSCOPY OF EPITAXIAL STRUCTURES
    KISELEV, NA
    VASILIEV, AL
    LEBEDEV, OI
    GIVARGIZOV, EI
    STEPANOVA, AN
    KISELEV, AN
    HUTCHISON, J
    [J]. MICROSCOPY OF SEMICONDUCTING MATERIALS 1993, 1993, (134): : 341 - 348
  • [10] TRANSMISSION ELECTRON-MICROSCOPY AND PHOTOEMISSION ELECTRON-MICROSCOPY OF STEELS
    EDMONDS, DV
    [J]. MICROSCOPE, 1979, 27 (3-4): : 162 - 162
12345